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ITECH IT2800 Series – Graphical Source Measure Unit

The IT2800 Series are compact and cost-effective bench-top Source Measure Units (SMUs) with the capability to source and measure both voltage and current. The IT2800 Series combine the capabilities of a voltage source, a current source, a voltage meter, a current meter and an ohmmeter (along with the capability to switch easily between these various functions). With a current range of 10fA to 10A and a voltage range of 100nV to 1000V, the IT2800 series SMU has capabilities that allow it to perform more than just simple DC and pulsed measurements to prevent errors in measurement results due to the device’s own heating.

Yokogawa GS200 – DC Voltage / Current Source

  • Source and sink operation up to 110 V/3.2 A (four-quadrant operation)
  • Basic accuracy: ±0.02% (DC voltage generation)
  • Sweep output at up to 100μs intervals
  • Comes with abundant sweep patterns (linear, logarithmic, and arbitrary)
  • Stores up to 65535 points of source measure data in the internal memory
  • Easy file operation with the USB storage function
  • Remote control and FTP using Web server function (Optional)

Yokogawa GS610 – Source Measure Unit

  • Source and sink operation up to 110 V/3.2 A (four-quadrant operation)
  • Basic accuracy: ±0.02% (DC voltage generation)
  • Sweep output at up to 100μs intervals
  • Comes with abundant sweep patterns (linear, logarithmic, and arbitrary)
  • Stores up to 65535 points of source measure data in the internal memory
  • Easy file operation with the USB storage function
  • Remote control and FTP using Web server function (Optional)

Yokogawa GS820 – Multi Channel Source Measure Unit

  • Isolated 2-channel source and measurement function
  • Source and measurement ranges
    18 V model: 7 V and 3.2 A or 18 V and 1.2 A
    50 V model: 20 V and 1.2 A or 50 V and 0.6 A
  • 1pA resolution at extremely small current range 200 nA
  • Generate arbitrary waveforms consisting of up to
    100000 points at 100 µs intervals
  • Channel expansion through master-slave
    synchronization link
  • Fast test speeds