Yokogawa TA220 Analog Display Time Interval Analyzers(discontinued)

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TA220
Characteristics:
  • Bluray Disc equalizer and PLL
  • Limit equalizer (optional)
  • Capable of measuring datatoclock jitter and pulse width jitter
  • Standardequipped with function for analyzing datatoclock jitter excluding 2T
  • Inhibit function and block sampling function
  • Standardequipped with Ethernet and GPIB interfaces
  • A variety of display capabilities, with analog meter and two LED indicators
Product Description: 
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The TA220 Digital Jitter Meter is a jitter measuring instrument designed for production line applications for Blu-ray Disc– the next generation high capacity optical disc standard. The TA220 includes a Blu-ray Disc equalizer and PLL circuit that enable measurement from RF signals to jitter directly. And for remote control, Ethernet and GP-IB communication functions come standard.
Sophisticated measurement functions
  • Blu-ray Disc equalizer and PLL With a Blu-ray Disc equalizer, auto-slicer, and PLL clock regeneration circuit (66 MHz), the TA220 can measure data-to-clock jitter directly from RF signal inputs. In addition to the conventional equalizer which is provided as a standard feature, an optional limit equalizer is also available.
  • Data-to-clock jitter and pulse width jitter measurement capability The TA220 can measure Blu-ray Disc data-to-clock jitter and pulse width jitter (data-to-data jitter). During pulse width measurements, any window width can be set, so it is also possible to measure mean values and the jitter for pulse widths other than 2T (e.g., 3T and 8T).
Compatibility with testing systems
  • Standard-equipped with Ethernet and GP-IB interfaces The Ethernet or GP-IB interface can be used to download TA220 measurement results to a PC, or to control measurement condition settings or start/stop measurement.
  • Measurements synchronized with an external device (inhibit function, arming function, block sampling function) The inhibit function allows you to measure just a specified range using an external gate signal. The block sampling function stores data obtained from repeated measurements. If you are taking repeated measurements of a small recording area, you can use the arming function to specify the measurement start point based on an external trigger signal, and use the inhibit function to limit the measurement area. These functions can be combined with the block sampling function to perform repeated measurements and store measurement data, so that you have enough samples to perform an analysis.
  • Advanced I/O capabilities The jitter ratio is converted to a 0.2 V/% (initial value) analog voltage value and output through the JITTER DC OUT port on the rear panel, so measurement results can be output through the A/D converter board on the tester without using a communication interface.
Improved production efficiency
  • Store/Recall function As many as seven panel settings can be stored in and recalled from the internal memory. You can significantly reduce the time required to set up the jitter meter by storing settings for each evaluation parameter in the internal memory.
  • DtoC high-speed calculation function DC OUT During data-to-clock jitter measurement, the output from JITTER DC OUT can be updated as quickly as every two milliseconds. This capability makes it possible to check relative jitter fluctuations over a disc rotation using an oscilloscope or other instrument.
Functions :
space The TA220 has the functions you need for production line adjustments and testing, including data-to-clock jitter measurement, data-to-clock jitter measurement excluding 2T marks and spaces, clock period measurement, pulse width measurement, and input signal amplitude measurement.
Data-to-clock jitter measurement The TA220 can internally generate a synchronous clock from an RF signal for data-to-clock jitter measurement. The polarity of data edge can be selected from “↑”, “↓”, and “↑&↓”.
  • Data-to-clock jitter measurement excluding 2T If you select the [E2T] measurement function, you can measure data-to-clock jitter excluding the edges adjacent to 2T marks and spaces. This function is useful for testing dual-layer discs.
  • Clock period measurement This function measures the period of the internally generated PLL clock. This function is useful for checking whether the disc rotation speed is stable.
  • Pulse width (data-to-data) jitter measurement This function can be used to measure pulse width (data-to-data) jitter and average values. The window can be set to any value (0.00 to 999.99 nanoseconds), so you can even measure jitter and pulse width average values for recording lengths other than 2T, such as 3T and 8T. The store/recall function makes it easy to recall separate settings for each recording length.
  • Level measurement With this function, the amplitude (Vp-p) of the input RF signal can be measured simultaneously with the jitter measurement. This can be used when the D-to-C high-speed calculation function is off. Measurement results are displayed numerically on the front panel LED, and also output as analog voltage (initial value: 1 V/1 Vp-p) through an output connector on the rear panel.
pdf_pic Downloads:General Specifications
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Blu-ray Disc equalizer and PLL circuit
The TA220 has a conventional equalizer conforming to Blu-ray Disc RE standard version 1.0, as well as an auto-slicer and PLL clock regeneration circuit. These features can be used to measure jitter directly from an RF signal. The equalizer boost can be varied in 0.1 dB steps in the range of +3.0 dB to +9.0 dB. Maximum group delay deviation is very flat, at 1 nsp-p (3.0 MHz ≤ f ≤ 22 MHz). In addition, an optional limit equalizer can also be installed together with the conventional equalizer. Boost can be varied in the range of +3.0 dB to +9.0 dB. In addition, this equalizer has a preset menu of boost values for 23 GB, 25 GB, and 27 GB.
Store/Recall function
As many as seven TA220 settings can be stored in and recalled from the internal memory. The stored information includes all settings other than the GP-IB address. You can recall preset settings such as measurement function changes, boost settings, and window changes for pulse width jitter measurement. Even during automatic measurement, settings can be changed in a single step using the Store/Recall function, without sending multiple commands.
 
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