• YOKOGAWA

AQ6374 Optical Spectrum Analyzer

The AQ6374 Wide Range Optical Spectrum Analyzer covers wavelengths from 350 to 1750 nm including visible lights (380 to 780 nm) and the telecommunication wavelengths.

Yokogawa AQ6374 Optical Spectrum Analyzer Series

Features

  • Wavelength range: 350 to 1750nm
  • High wavelength accuracy: ±0.05nm
  • High wavelength resolution: 0.05 to 10 nm
  • Wide dynamic range: 60dB (peak ±1.0nm)
  • Wide level range: +20 to -80dBm
  • Fast measurement: 0.5 sec. (100nm span)
  • 8 wavelength resolution settings: 0.05 to 10 nm
  • wide measurable level range is from−80 to +20 dBm
  • ±0.05 nm wavelength accuracy can be maintained by the calibration
  • Fast Measurment 0.5 s for 100 nm span (with sensitivity set to NORM_AUTO)
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    • Wavelength range: 350 to 1200nm
    • Wavelength accuracy: ±0.05 nm
    • Wavelength resolution: 0.02 to 10 nm and 0.01nm (400 to 470nm)
    • Max safe input power: +20 dBm
    • Level sensitivity: -80 dBm
    • Dynamic range: ≧60dB
    • Single-mode, Multimode, and Large-core fibers
    • Built-in optical alignment source
    • Wavelength calibration with an external reference source
    • Various analysis functions including the Color analysis function for VIS

Applications

  • Optical active devices(Laser diode/Fiber laser)
  • Optical passive devices(Filter/FBG/Specialty optical fiber)
  • Development support of Applied photonics equipment
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  • Telecommunication: with glass fiber or plastic fiber
  • Industrial: Barcode scanners, LiDAR surface scanners
  • Consumer electronics: audio output of Hi-Fi audio systems, laser printers, computer mice

Description

The AQ6374 features a wide dynamic range and high wavelength resolution and is capable of precisely measuring the optical spectrum of laser light in the 350 to 1750 nm wavelength range. Optical spectrum analyzers are used to resolve the wavelength components of optical devices such as semiconductor lasers and fiber lasers in order to assess their characteristics. The AQ6374 will be the only optical spectrum analyzer on offer in the market today that is capable of covering both the visible light wavelengths and the wavelengths used in optical communications.

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Wide Wavelength Range – The AQ6374 is the only analyzer on the market that is capable of evaluating and analyzing both the visible light wavelengths and the wavelengths used in optical communications. With a maximum resolution of 2 pm and the ability to sample power levels at up to 100,000 wavelength points, the AQ6374 can precisely evaluate and analyze a wide range of wavelengths with a single scan. The AQ6374 also features a wide close-in dynamic range of 60 dB, which is sufficient for measuring the side mode characteristics of a semiconductor laser*4. This instrument can thus be used to develop distributed semiconductor devices such as feedback laser diodes (DFB-LD) that emit only one wavelength as well as optical fibers that necessitate measurements over a wide range of wavelengths. Accurate Measurement of optical light spectrum – The AQ6374 comes with two additional enhancements. The first is a function that purges the water vapor trapped in its monochromator that can suppress the absorption of light at certain wavelengths. The second is a function that reduces the effect of high-order diffracted light whose wavelengths are 2–3 times that of incident light, a characteristic that all monochromators have due to their design principle.
 
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Literature and Technical Information
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Optical Spectrum Analyzers

++ AQ6370 Series Specification Brochure | 1.5 MB
Model: AQ6373B OSA Series
Display: 10.4-inch color LCD
Display Resolution: 800 × 600
Models  
Wavelength Range: 350 to 1200 nm
Span: 0.5 nm to 850 nm (full span), and 0 nm
Accuracy ±0.05 nm (633 nm), ±0.20 nm (400 to 1100 nm) (After wavelength calibration with 633 nm He-Ne laser.)
Linearity: ±0.01 nm (1520 to 1580 nm), ±0.02 nm (1450 to 1520 nm, 1580 to 1620 nm)
repeatability: 0.02, 0.05, 0.1, 0.2, 0.5, 1 and 2 nm
Resolution Setting: 0.02, 0.05, 0.1, 0.2, 0.5, 1, 2, 5, 10 nm (full range), and 0.01 nm (400 to 470 nm)
Min. Sampling Res.: 0.001 nm
Level Sensitivity Setting: NORM_HOLD, NORM_AUTO, NORMAL, MID, HIGH1, HIGH2 and HIGH3
High Dynamic Mode: SWITCH (Sensitivity: MID, HIGH1-3)
Level
Sensitivity: −80 dBm (500 to 1000 nm),
−60 dBm (400 to 500 nm, 1000 to 1100 nm)
(Typical, Resolution setting: ≥ 0.2 nm, Averaging: 10 times, Sensitivity: HIGH3)
Max. Input: +20 dBm (Per channel, full range)
Max. Safe Input: +20 dBm (550 to 1100 nm),
+10 dBm (400 to 550 nm) (Total input power)
Accuracy: ±1.0 dB (850 nm, Input level: −20 dBm,
Resolution setting: ≥ 0.2 nm, Sensitivity: MID, HIGH1-3, SMF [MFD 5 μm@850 nm, NA0.14])
Linearity: ±0.2 dB (Input level: −40 to 0 dBm, Sensitivity: HIGH1-3)
Dynamic Range
Range: 60 dB (Peak ±0.5 nm, Resolution setting: 0.02 nm, 633 nm, Sensitivity: HIGH1-3)
Functions
Measurement
Measurement: CW light, Pulsed light, External trigger, Gate sampling*, Air/vacuum wavelength
Sweep Mode: Repeat, Single, AUTO (Self-configuration), Sweep between line markers, Zero span sweep (0 nm span), Data logging
Condition Settings: Center wavelength, Span, Number of sampling, Wavelength resolution, Sensitivity, High dynamic mode, Number of averaging (1 to 999 times), Double speed mode*, Smoothing (excl. AQ6375), APC level correction
Others: Sweep status output, Analog output
Display
Vertical Scale: Level scale (0.1 to 10 dB/div. and linear), Level subscale (0.1 to 10 dB/div. and linear), Reference level, Divisions (8, 10 or 12), power spectral density (dB/nm), dB/km, %, Noise mask
Horizontal Scale: Wavelength (nm), Frequency (THz), Wave number (cm-1), Trace zoom in/out
Display Mode: Normal display, Split display, Data table, Label, Template, Measurement conditions
Trace
Functions: 7 independent traces, Maximum/Minimum hold, Calculation between traces, Normalizing, Curve fit, Peak curve fit, Marker curve fit, Roll averaging (2 to 100 times)
Others: Trace copy/clear, Write/Fix setting, Display/Blank setting
Data Analysis
Functions: Spectral width (threshold, envelope, RMS, peak-RMS, notch), WDM (OSNR) analysis, EDFA-NF analysis (excl. AQ6373), Filter peak/bottom analysis, WDM filter peak/bottom analysis, DFB-LD/ FP-LD/ LED analysis, SMSR analysis, Power analysis, PMD analysis, Color analysis (AQ6373 only), Pass/Fail analysis with template
Others: Auto-analysis (ON/OFF), Analysis between horizontal line markers, Analysis in zoomed area
Automated Measurement
Program Function: 64 programs, 200 steps per program
Others: Auto-analysis (ON/OFF), Analysis between horizontal line markers, Analysis in zoomed area
Other Functions
Optical Alignment: Auto-optical alignment with built-in light source or an external reference source.
Wavelength Calibration: Auto-wavelength calibration with built-in wavelength reference source (excl. AQ6373) or an external wavelength reference source.
Resolution: Resolution calibration with an external reference source.
Specifications
Electrical interface: GP-IB × 2 (standard/controller)
Remote control: GP-IB, RS-232, Ethernet (TCP/IP)
Data storage: Internal storage: 512 MBytes,
Internal memory: 64 Traces, 64 programs, 3 template lines,
External storage: USB storage (memory/HDD), FAT32 format
File types: CSV (text), Binary, BMP, TIFF
Power Requirements: 100 to 240 V AC, 50/60 Hz, approx. 100 VA
Power: Maximum 150W
Temperature Range: Performance guarantee temperature: +18 to +28°C
Operating temperature: +5 to +35°C
Storage temperature: −10 to +50°C
Humidity Range: Humidity: ≤ 80%RH (no condensation)
Dimensions: 426 (W) × 221 (H) × 459 (D) mm
(Excluding protector and handle)
Weight: 20 kg, Without printer option
Safety: UL 61010-1:2004 ; CAN/CSA-C22.2 NO. 61010-1-2004 ; EN 61010-1:2001 ; IEC 61010-1:2001